Polarization properties of single-walled carbon nanotube thin film on silicon substrate in terahertz frequency range

Abstract

Terahertz time-domain spectroscopic polarimetry (THz-TDSP) method was used to study of polarization properties of a randomly oriented single-walled carbon nanotube (SWCNT) thin film on a silicon (Si) substrate in terahertz (THz) frequency range under an external optical pumping (OP) and an external static magnetic field (MF). Frequency dependencies of azimuth and ellipticity angles of a polarization ellipse and the polarization ellipse at various frequencies of the Si substrate and the SWCNT thin film on the Si substrate were obtained experimentally. The results confirm the fact that, based on carbon nanotubes, it is possible to devise efficient tunable THz polarization modulators for use in the latest security and telecommunication systems.