Abstract
A novel polarization measurement approach using multi-slit diffraction method is proposed in this paper. Part of binary grating is covered by one polarizer. And based on Fraunhofer diffraction, the diffraction intensity formula is deduced. Then we can get the polarization state of the incident light by fitting the measured diffraction pattern with theory diffraction intensity formula. This method only uses polarizer, but not 1/4 waveplate, therefore, it can be applied to measure monochromatic light of any wavelength without a replacing device.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
