Abstract

The copolymer of vinylidene fluoride (VDF) with trifluoroethylene (TrFE) has attracted much interest due to the potential use in nonvolatile memory devices with easy formability. A repetitive application of electric stress causes a decrease of switchable polarization. This phenomenon, referred to as fatigue, is one of the primary sources of concern in the ferroelectric memory devices. Having realized that a conventional Al electrode suppresses the leakage current for the existence of the oxidation layer but induces severe thickness effect, we investigated the fatigue characteristics in VDF/TrFE copolymer thin films with Au electrodes. In this work, we report on the finding of three fatigue stages and discuss the fatigue mechanisms in relation to the structural changes.

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