Abstract

A new method of measuring the intensity and state of polarization of optical radiation by means of the high resolution polarization interference imaging spectrometer (PIIS) is introduced and theoretically investigated in this paper. The error accuracy analysis is proposed, and it is proved that the system is very stable and precise in theory. In this new way, the polarized characteristics of light could be taken good use to analyze and distinguish objects in passive remote sensing with the PIIS, which means that the polarization interference imaging spectrometer now can be used not only as cameras and interferometers but also as polaristrobometers.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.