Abstract
Pure phase TbMnO3 manganite thin films with hexagonal (h-TMO) and orthorhombic (o- TMO) crystal structures were prepared by pulsed laser deposition. The distinctive orientation alignments between film and substrate obtained here have allowed us to perform the x-ray absorption near edge spectroscopy (XANES) measurements with the electric field applied along the three major crystallographic directions. The XANES results, as expected, display significantly different spectral features for the h-TMO and o-TMO films. In addition, the XANES spectra also exhibit strong polarization dependence at O K and Mn L edges for both samples.
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