Polarization behavior of zinc oxide thin films studied by temperature dependent spectroscopic ellipsometry

Abstract

We report on the influence of temperature on the polarization behavior of highly oriented ZnO thin film. First, the investigation of crystal structure change is studied, providing supporting information on the macroscopic-scale polarization of the ZnO thin film. Here, the lattice distortion is investigated by using X-ray diffraction. Furthermore, the role of temperature on the polarization behavior of the ZnO thin film is comprehensively studied by using temperature dependent spectroscopic ellipsometry. Here, the temperature dependent dielectric function analysis and electronic excitation models are used to understand the mechanism of polarization. We found an interesting temperature dependence of electronic transition, where the red-shift absorption and exciton-phonon interaction are observed on the system. This interaction is responsible for the increase of polarization response, which is confirmed by dielectric susceptibility spectra. These results provide important understanding for the control of the polarization dependence on the working temperature of ZnO thin film, which is the essential key in the fabrication of switchable optical devices.