Abstract
Polarization is one of the important properties of light, and its detection is of significant interest for various fundamental and practical applications. We demonstrate a mid-infrared polarimetry device using a gate-tunable graphene-integrated anisotropic metasurface. The Stokes parameters of the incident light are extracted by sweeping the gate voltage applied to the device and subsequent fitting of the measured reflected intensities. Considering subpicosecond carrier relaxation times in graphene, the polarization measurement rate of our device is governed only by the speed of the gate voltage sweep. Thus, our work serves as a proof-of-principle demonstration for high-speed microscale polarimetric devices.
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