Polarimetric Two-Scale Model for Rough Surface Bistatic Scattering Evaluation

Abstract

The Two-Scale Model (TSM) is a widely used approach for the computation of scattering from rough surfaces. However, in its original formulation a computationally intensive numerical integration is required to effectively model depolarization effects. In the last decade the Polarimetric TSM (PTSM) has been developed to overcome this limitation, providing a closed-form expression able to account cross-polarization and depolarization effects. Very recently, PTSM has been also extended to the case of anisotropic rough surfaces (APTSM). However, until now only the monostatic configuration has been considered. In this paper we extend A-PTSM to the general case of bistatic scattering, presenting the procedure to obtain all the elements of the bistatic polarimetric covariance matrix. Finally, the behavior of the obtained elements is discussed and relevant numerical examples are provided and compared to more refined, but more computationally intensive, methods.