Polarimetric NIR reflectance measurements of regolith simulants at zero phase angle

Abstract

Polarimetric reflectance measurements have been made at a wavelength of ∼ 1 μ m for a suite of predominantly lunar regolith simulants in support of development efforts for the BepiColombo Laser Altimeter (BELA). Measurements were made using an instrument at the University of Bern, Switzerland, that has been modified to accommodate photometric characterizations of laboratory samples down to 0 ∘ phase angle ( g ) with linearly polarized illumination and a linearly polarized receiver. The data reveal opposition surges that are dominated by polarization state-conserving reflectance terms for all samples. Relative strengths of the trans-state reflectance terms are lowest for the darkest samples, suggesting that multiple scattering is responsible for state conversions. Normal albedo measurements of the lunar simulants range from 0.13 to 0.22 at zero illumination angle ( i = 0 ∘ ). The total reflectance of the regolith simulants at g = 0 ∘ were found to decrease with increasing i , which is inconsistent with predictions of reflectance models for Mercury. However, the g = 0 ∘ reflectance remains higher at i > 0 ∘ than would be expected for a gray Lambert surface that is scaled to the g = i = 0 ∘ reflectance value. Polarization ratios for reflectance under polarized illumination but unconstrained emission show that the samples scatter light in the in-plane polarization state more efficiently than in the transverse state at g = 0 ∘ and i > 0 ∘ . The opposite is true for g > 0 ∘ polarization ratios, which indicate that transverse polarized illumination scatters more efficiently at high g . The polarization effect appears to correlate with the sample's characteristic grain size, but the statistical basis of this trend is weak. The implications of these measurements upon the performance of the BELA instrument are discussed.