Polarimetric modeling and measurement approach for refractory material in the mid-wave infrared

Abstract

Passive polarimetric imaging has gained substantial attention over the past three decades in various applications in defense. The complexity of polarimetry modeling and measurement in the thermal infrared exceeds that of the visible and near-infrared due to the complementary polarization orientation of reflected and emitted radiance. This paper presents a comprehensive polarimetric radiance model and a degree of linear polarization (DOLP) model, both of which are specifically tailored for the infrared spectrum, accounting for both reflected and emitted radiance. Building on this foundation, we conduct an analysis and simulation of the DOLP’s variation as the object temperature changes. This analysis enables the observation of relationships that can be strategically utilized in subsequent experiments focused on measuring polarized model parameters. To mitigate the influence of reflected radiance components, the samples are subjected to high temperatures. The observed Stokes images from the sample surfaces are normalized to eliminate the dependence of each Stokes image on temperature. This parameters acquisition measurement method is particularly well-suited for refractories. Finally, the efficacy of the polarized model parameters acquisition technique is demonstrated through experiments involving three distinct refractory materials in the MWIR.