Abstract
Lead zirconate titanate (PZT) film with polar axis orientation was grown on a SUS 316L stainless steel substrate with the help of a Ca2Nb3O10 nanosheet (ns-CN) layer that had a pseudo-perovskite-type crystal structure. The ns-CN buffer layer was supported on a platinized SUS 316L (Pt/SUS) substrate, followed by chemical solution deposition (CSD) of the PZT films with tetragonal symmetry (Zr/Ti =40/60). The PZT films consisting of c-domain, with [001]-axis orientation of the perovskite unit cell, were deposited on the ns-CN/Pt/SUS substrate owing to (i) epitaxial lattice matching between the unit cell of PZT and substrate surface and (ii) in-plane thermal stress applied to the PZT film during cooling-down step of CSD procedure. The c-domain-oriented PZT film on ns-CN/Pt/SUS substrate exhibited enhanced remanent polarization of approximately 52 μC/cm2 and lowered dielectric permittivity of approximately 230, which are superior to those of conventional PZT films with random crystal orientation and comparable to those of epitaxial PZT films grown on (100)SrRuO3//(100)SrTiO3 substrates.
Highlights
Perovskite-type lead zirconate titanate [Pb(Zr, Ti)O3; PZT] crystals exhibit anisotropic ferroelectric property depending on their crystallographic orientation, for example, polar-axis along the [001] and [111] directions in tetragonal and rhombohedral systems, respectively.[1,2] Epitaxial thin films of PZT grown on the single crystal substrates of perovskite-type oxides (SrTiO3, etc.) or other analogs (CaF2, etc.)[3,4,5,6] exhibit anisotropic ferroelectric behaviors depending on their crystal orientation normal to the film surface
The PZT films consisting of c-domain, with [001]-axis orientation of the perovskite unit cell, were deposited on the ns-CN/platinized SUS 316L (Pt/SUS) substrate owing to (i) epitaxial lattice matching between the unit cell of PZT and substrate surface and (ii) in-plane thermal stress applied to the PZT film during cooling-down step of chemical solution deposition (CSD) procedure
We report the crystal growth of tetragonal PZT films with c-domain texture via a chemical solution deposition (CSD) route on the surface of a versatile stainless steel substrate buffered by a nanosheet CN layer, which has been accomplished in only one analogous case, i.e., nickel foils with (100)LaNiO3/HfO2 multiple buffer layer.[14]
Summary
Perovskite-type lead zirconate titanate [Pb(Zr, Ti)O3; PZT] crystals exhibit anisotropic ferroelectric property depending on their crystallographic orientation, for example, polar-axis along the [001] and [111] directions in tetragonal and rhombohedral systems, respectively.[1,2] Epitaxial thin films of PZT grown on the single crystal substrates of perovskite-type oxides (SrTiO3, etc.) or other analogs (CaF2, etc.)[3,4,5,6] exhibit anisotropic ferroelectric behaviors depending on their crystal orientation normal to the film surface. Polar-axis-oriented crystal growth of tetragonal PZT films on stainless steel substrate using pseudo-perovskite nanosheet buffer layer
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