Point-Focus X-Ray Monochromators for Low Angle Diffraction

Abstract

Guinier has applied the principle of the reflection type curved crystal focusing x-ray monochromator to improve both intensity and angular resolution in low angle x-ray diffraction studies. In Guinier's method, a thin sample is placed in the convergent monochromatic x-ray beam and the low angle diffraction pattern is formed as a diffuse distribution symmetrically disposed on either side of the central primary line focused by the crystal.