Point-projection x-ray radiography using an X pinch as the radiation source

Abstract

Using an X pinch as a source of radiation for point-projection radiography, it is possible to project a high-resolution (1–10 μm) shadow image of dense plasma or test objects onto x-ray-sensitive film. The emission characteristics of X pinches composed of a wide variety of materials have been studied using several diagnostics. The pulse duration and shape of the x-ray bursts were measured in the 1.5–6 keV band using fast diamond PCDs and an x-ray streak camera with sweep speeds as fast as 10 ns for the full sweep (3.5 cm). To investigate the line and continuum radiation emitted by the X pinches, a convex spectrograph using a mica or KAP crystal, and a spectrograph based on a spherically bent mica crystal were used. Summarizing the data, including radiography results, wires known to have slower expansion rates and high boiling temperatures (NiCr, Ti, Nb, Mo, Pd, Ta, W, and Pt) appeared to yield the smallest x-ray source sizes, i.e., gave the best spatial resolution in radiographs and provided subnanosecond time resolution. All of these materials yield intense continuum radiation with energy up to 6 keV, and the highest resolution images are achieved using only the continuum radiation from the X pinch.