Abstract
This paper proposes a robust method for matching labeled point patterns. A point pattern is partitioned into a set of triangles using the Delaunay triangulation. For the corresponding triangle pair, a consistency graph is constructed based on the pairwise compatibility between the points in the triangles. The matching is accomplished by locating the largest maximal clique of the consistency graph. A new method for detecting corners is also proposed, based on the local symmetry of a discrete curve. The corners are used as the feature points in point pattern representation and matching of the line drawings.
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