Abstract

Red phosphorus (RP) has been demonstrated for photocatalytic hydrogen evolution (PHE) in recent years. Realistically, P vacancy (VP) defects are present in RP. The constructive or detrimental influences of such defects on the photocatalytic activity of RP should be revealed as the understanding shall provide a platform for further improvement. Herein, we for the first time establish a comprehensive understanding of the crucial relationships between the intrinsic VP defects and the charge dynamics together with the photocatalytic performance in RP. Two main findings are achieved: i) VP-induced deep charge trapping effect is revealed to lead to a severe loss of active electrons during the H+ reduction reaction, resulting in the inferior PHE performance of RP. ii) O doping in the VP sites is demonstrated to be an effective strategy for eliminating the detrimental VP defect states, leading to a long-lived free electron lifetime in RP for enhanced PHE performance. The point defect engineering of RP applied in this study paves a promising way in tuning the physicochemical properties of RP and other elemental-based materials for various applications.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.