Abstract

Layered transition-metal dichalcogenides (TMDs) constitute an emerging class of materials that provide researchers a platform to realize fundamental studies and to design promising optoelectronic devices. While defects are an almost unavoidable part of TMDs, they bring additional interesting properties absent in defect-free layers. Moreover, the controlled introduction of defects in TMDs makes it possible to tailor the electromagnetic properties of the materials. Here we report defect-induced properties of single-layer $\mathrm{Pd}{\mathrm{Se}}_{2}$ and demonstrate the emergence of magnetism at the nanoscale. Our first-principle calculations indicate that Se vacancies create in-gap defect states, which can be responsible for trapping of carriers. The complex square ${V}_{\mathrm{Pd}+4\mathrm{Se}}$ vacancy induces spin-polarized states with a total local magnetic moment of $2\phantom{\rule{0.16em}{0ex}}{\ensuremath{\mu}}_{\mathrm{B}}$ per defect, making it possible to introduce magnetization into $\mathrm{Pd}{\mathrm{Se}}_{2}$ and therefore expand the family of two-dimensional (2D) magnets. The defect formation energies are much lower compared to many other TMD materials that can explain the presence of a large number of Se defects after mechanical exfoliation of $\mathrm{Pd}{\mathrm{Se}}_{2}$ layers, while the central location of the Pd atoms preserves them from exfoliation-induced defect formation. The negatively charged vacancies are prone to form and in many cases demonstrate spin-polarized states. The small diffusion barrier of ${\mathrm{V}}_{\mathrm{Se}}$ in 2D $\mathrm{Pd}{\mathrm{Se}}_{2}$ leads to an easy room-temperature migration, while ${\mathrm{V}}_{\mathrm{Pd}}$ demonstrates a high diffusion barrier preventing its spontaneous migration. As a guide for experimentalists, we simulate and characterize scanning tunneling microscope images in valence and conduction states and estimate the electron-beam energy for a controllable production of various defect patterns. These intriguing findings make $\mathrm{Pd}{\mathrm{Se}}_{2}$ an ideal platform to study defect-induced phenomena.

Highlights

  • Two-dimensional (2D) transition-metal dichalcogenides (TMDs) are part of the family of layered van der Waals materials and have been highlighted as good candidates for next-generation optoelectronics materials [1,2,3,4,5,6,7]

  • The defect formation energies are much lower compared to many other TMD materials that can explain the presence of a large number of Se defects after mechanical exfoliation of PdSe2 layers, while the central location of the Pd atoms preserves them from exfoliation-induced defect formation

  • The charge-density distributions in the valence and conduction bands of SL-PdSe2 [Fig. 1(b)] reveal the predominant character of the topmost Se atoms, which form zigzag chains giving the main contribution to the formation of scanning tunneling microscope (STM) images (Fig. 2), whereas Pd atoms are hidden in these regions due to a relatively weak electron density and their middle-layer position

Read more

Summary

Introduction

Two-dimensional (2D) transition-metal dichalcogenides (TMDs) are part of the family of layered van der Waals materials and have been highlighted as good candidates for next-generation optoelectronics materials [1,2,3,4,5,6,7]. TMD is prone to form chalcogen vacancies [10,67,68,69], while the structural features of PdSe2 and the relatively high exfoliation energy should result in much more sensitivity to defect formation compared to Mo dichalcogenides.

Results
Conclusion
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call