Abstract
Platinum is reported as the main component of the substrate in surface plasmon microscopy of the metal-dielectric interface for small-angle measurements. In the absence of a narrow dip in the angular spectrum of platinum, the refractive index of the dielectric medium or the thickness of a deposited layer is proven deducible from the observed sharp peak, close to the critical angle. The sensitivities of refractive index and thickness measurements using platinum are compared with that of a gold surface plasmon resonance chip. Furthermore, the thickness of a structured layer of (3-Aminopropyl)triethoxysilane on the platinum substrate is measured to be 0.7 nm, demonstrating the high sensitivity of the technique.
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