Abstract
Transmission electron microscopy was used to study Si/SiO 2 interfaces in Pt doped fast rectifiers. Orthorhombic PtSi (monocrystalline) precipitates at the n+-Si/SiO 2 and p+-Si/SiO 2 interfaces were observed. This precipitation can be related to the presence of dislocations induced by the P or B doping (networks parallel to the surface) and to SiP precipitates. Two epitaxial relationships were observed for the PtSi precipitation : (010) Pt∥Si {111} Si and (001) PtSi∥ {l10} Si. Different Pt diffusion temperatures and cooling rates were used and it was shown that the reverse recovery time is influenced by the diffusion temperature, whereas the gettering efficiency and the occurrence of soft breakdown are reduced by slow cooling.
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