Abstract
The gap mode enhancement of metal nanoparticles is introduced into wide-field Raman microscopic imaging, where it produces a more efficient Raman scattering map compared with the scanning mechanism based on a single nanoparticle. Patterned surface plasmon illumination technique is employed to extend spatial resolution of the wide-field Raman imaging to 133 nm achieved by a modified total internal reflection microscope. The images by different Raman shifts are extracted by using narrow band pass dielectric filters. The technique can serve as a robust tool for wide-field surface enhanced Raman imaging.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
