Abstract

Liquid-crystal displays (LCDs) are the most frequently used display technology worldwide these days. Due to the rather complex manufacturing process and purity requirements for the chemicals used, quality control and display failure analysis are important analytical tasks. Currently, the state-of-the-art techniques (e.g., high-performance liquid chromatography (HPLC), gas chromatography (GC) coupled to mass spectrometry (MS), time-of-flight secondary ion mass spectrometry (TOF-SIMS), or high-resolution microscopy) are costly and time-consuming. Hence, a new pathway to precisely analyze liquid-crystalline materials and LCDs in their native state is reported. A new approach for direct analysis via plasma-based ambient desorption/ionization mass spectrometry (ADI-MS) offers an inexpensive and faster alternative. In this study, direct analysis in real time (DART), the low-temperature plasma (LTP) probe, and flowing atmospheric-pressure afterglow (FAPA) ADI sources coupled to high-resolution mass spectrometry (HR-MS) are compared based on their capabilities and performance for liquid-crystal analysis. These sources enable direct analyte desorption from a sample surface at ambient conditions and ionize the vaporized analyte molecules in a subsequent step. Primarily, the ionization capabilities of the three ADI sources are compared for individual liquid-crystal standards, mixtures of liquid crystals (LCs), and complex liquid crystal/additive mixtures applied in commercially available LCDs. Furthermore, direct surface analysis from a glass substrate is also performed with ADI-MS to compare their applicability to this type of sample matrix.

Full Text
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