Plasma Surface Modification of Fluoropolymers Studied by ToF-SIMS

Abstract

Surface modification by plasma treatment is an efficient way of improving metal adhesion to polymers. Here, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is used to characterize the surfaces of Teflon PFA and Teflon AF1600 films, following plasma treatments in H2, O2 and N2 gases. This work is complementary to our previous study using XPS, and is particularly directed toward the identification of incorporated hydrocarbons which could seriously affect metal adhesion. Plasma treatments strongly modify the surfaces of fluoropolymers, causing the ablation of a part of the fluorocarbon structure, with H2 being the most effective gas. The hydrocarbon content of such surfaces is not negligible, and a comparison with hydrocarbon levels on untreated surfaces suggests that a substantial fraction of this material was incorporated on plasma treatment; this is particularly so in the case of H2 plasma treatment. Due to expected strong matrix effects caused by significant changes in surface chemistry and structure following the various plasma treatments, the use of SIMS absolute intensity values is discussed in terms of data treatment artifacts. Moreover, due to the differences in secondary ion yields between characteristic hydrocarbon and fluorocarbon SIMS peaks, the use of peaks normalized to the total intensity is also impractical. Here, positive mode absolute intensities and negative mode peak intensity values, when normalized to Itot - I(H−) - I(F−), give valuable information, as in the comparison of hydrocarbon and N incorporations.