Abstract
An electron interferometer or an interference electron microscope may be easily constructed from a standard electron microscope by inserting an electrostatic biprism of the Möllenstedt-Düker type. The effect of the biprism on the electron image is briefly analysed in this article using the geometric optical approximation. Different electron optical set-ups are discussed and are illustrated by three examples relative to: thickness measurements of silver nuclei; an in-focus analysis of the magnetic domain wall; and an in-focus detection of the microelectric field associated with reverse-biased p-n junctions. The possibilities of applying this method to the study of electron optical phase objects are discussed.
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