Abstract
A novel technique for determining the plane-wave shielding effectiveness of thin films utilizing a TEM mode structure has been previously described. This letter presents some of the results obtained. In addition, note is made of an error which existed in the original measurement setup and its effect on the results is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
