Abstract
Plane wave migration in vertical transversely isotropic (VTI) media and tilted transversely isotropic (TTI) media is studied in this paper. We combine the theory of plane wave migration in isotropic media with the implicit finite-difference (IFD) extrapolation operator in TI (VTI and TTI) media, based on which, we extend plane wave migration to VTI and TTI media. Synthetic Hess VTI data and TTI data verify the effectiveness of the method. Compared with conventional shot-profile migration in TI media, plane wave migration largely reduces the computation cost with the same image quality, and has the advantage on imaging special steep reflectors. Plane wave migration in TI media provides a new thinking way for anisotropic studies.
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