Abstract
Features of a planar x-ray waveguide (PXW) functioned on the base of an x-ray total reflection phenomenon and been distinguished by an air clearance presense as the transportation medium are discussed. It is shown that the narrow size clearance area exists, and it is characterized by a resonance manner of an x-ray beam guiding across the waveguide. The high efficiency of the x-ray beam transporation systems based on planar x-ray waveguides allows them to complete with guiding abilities of the polycapillary optics. Characteristics of an x-ray diffractometer and TXRF-spectrometer equipped with PXW are analyzed. The experimental data of a thin film testing at application of the diffractometer and the TXRF spectrometer built with using PXW are presented. The design of the planar x-ray waveguide-monochromator is considered, in passing.
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