Abstract
A study of 100 keV Co +-implanted C 60 films with Rutherford Backscattering and Raman spectroscopy has revealed the pronounced cobalt translation from the surface layer of amorphous carbon into the deeper crystalline fullerene due to post-implantation annealing at 300 °C. Carbon density gradient along the film depth is discussed as a driving force of this effect. Cobalt deficit in the doped fullerene layer, detected by means of ion beam analysis, suggests ionization of the C 60 molecules under the collisions with 2 MeV He + ions.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
