Planar Array Failed Element(s) Radiation Pattern Correction: A Comparison

Abstract

Phased arrays are widely used in different fields, such as broadcasting, radar, optics, and space communications. The principle of phased arrays is to generate a directed signal from a large number of antennas to be steered at any desired angle. This, however, increases the probability of defective elements in an array. Faulty elements in an array cause asymmetry and result in increased sidelobe levels which rigorously distort the radiation pattern. Increased sidelobe radiation wastes energy and can cause interference by radiating and receiving signals in unintended directions. Therefore, it is necessary to find a method that can provide accuracy in the radiation pattern transmitted or received in the presence of failed element(s) in an array. This paper compares the few available optimization methods, namely, simulated annealing (SA), Genetic Algorithm (GA), Particle Swarm Optimization (PSO), and Pattern Search (PS) methods. For each method, various types of failures were examined, and the most suitable techniques to recover the far-field radiation are recommended. The optimization is then carried out by selecting the optimal weights of the remaining working elements in the planar array. The optimized radiation pattern’s efficiency was evaluated by comparing the Signal to Noise Ratio (SNR) value of the optimized radiation with reference and failed radiation patterns. The PSO method showed a better performance compared to all the other methods in reducing the failed radiation pattern’s SNR value. In various types of failure tests, this method reduced the failed radiation pattern’s SNR from 1 to 10 dB. This method also successfully produced a radiation pattern that closely matches the reference pattern before any failed element(s) are presented in the array. The life cycle of a planar array system with faulty elements can be increased by optimizing the remaining active elements in the array with the PSO method. It also reduces the cost of restoring and replacing the failed elements in an array regularly. This approach also prevents near-field measurement that requires complicated processes using costly equipment.