Abstract

In this work, the possibility of using reduced Graphene oxide for x-ray detection has been explored. A highly conductive reduced Graphene Oxide (rGO) synthesized using a hybrid method was used to fabricate a pixelated Si/SiO2 bottom gate field effect transistor. The fabricated device is a 3×3 pixelated large area detector and was tested for its response to x-rays at room temperature and low temperatures by irradiating it with x-rays from top. Significant change in resistance of rGO is observed during irradiation which shows its sensitivity to x-rays.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.