Abstract
Particle-Induced X-ray Emission has been used to measure Thallium concentration in several CsI(Tl) scintillators from different manufacturers, in order to check their nominal declared values and correlate their behaviour with actual Tl concentration. Indeed, both Tl doping level and its uniformity affect light emission of these detectors, which are largely employed in nuclear physics experiments.In some of the examined crystals Tl concentration values from PIXE measurements came out to be quite different from those declared. This allowed us to explain apparent anomalies in the trend of their α/γ-induced light yield ratio versus Tl content. In some cases, the presence of unexpected contaminants was also pointed out.
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