Abstract
TCAD simulations are conducted on a pinned photodiode (PPD), with the aim to reproduce the pinning voltage measurement developed by Tan et al. A thermionic model is proposed and detailed in order to explain the exponential injection occurring at an injection voltage higher than the pinning voltage, and the correct method to extract the transfer gate inversion voltage is given. Then, various nonidealities are simulated, such as doping variations or doping layer shifts, the goal being to get a PPD diagnostic tool based on the pinning voltage measurement. Finally, the PPD is simulated in a real reading mode, and a charge partition mechanism is demonstrated in specific conditions.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
