Abstract
Application of power higher than the optimum operation value to an external electrode fluorescent lamp (EEFL) leads to the formation of pinholes, which subsequently leads to lamp failure. Small holes, called pinholes, are formed through the external electrode and the glass tube when a high voltage with a high power is applied. The phenomenon of pinhole formation has been investigated, including the conditions under which they occur and the characteristics such as size and location on the electrode. Pinhole formation has been analysed and shown to be the insulation layer breakdown of glass in the dielectric barrier discharge of capacitively coupled EEFLs.
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