Pin-hole array production and detailed data analysis for advanced single-shot X-ray imaging of laboratory plasmas

Abstract

Laser produced plasmas offer the unique opportunity to investigate physical mechanisms working at extremely high field in pulsed regime [1] (Gizzi et al., 2009). Future large scale infrastructure like HiPER and ELI may open new frontiers of knowledge in this way. Technologies needed for improving diagnostic in this field have a strong impact on a wide range of multi-disciplinary applications as for compact plasma-based accelerators [1,2] (Gizzi et al., 2009; Betti et al., 2009) laser fusion oriented experiments, three-dimensional microscopy and lithography. As an example the X-ray imaging, being a powerful diagnostic tool for deep investigation on different variety of laser produced plasma, has obtained a grooving effort in recent years. Large scale facilities working in single-pulse regime for laser fusion oriented experiments have evidenced the necessity to obtain spectrally resolved X-ray images of produced plasmas in a single shot. By combining the charge coupled devices (CCD) based single-photon detection technique with a pin-hole array (PHA) a new diagnostic technique was developed, as shown in recent experiments related to the European HiPER project [3] (Labate et al., 2009). Here we qualitatively describe the PHA production process on a heavy metal substrate by means of SEM images that show an internal diameter on the micrometer scale and an aspect ratio of about 20. The characterization of the X-ray contrast up to 90 keV is presented. The data analysis of the X-ray photons interaction on CCD, for spectrum reconstruction up to high energy, is described [4] (Levato et al., 2008).