Abstract
Piezoresistive measurements have been performed on polycrystalline germanium films with different mean crystallite sizes in the temperature range from 115° to 625°K. The results are consistent with a structural model where the crystallites are supposed to be separated by thin layers of disordered material about 10 Å thick. Comparison of these results with those obtained on amorphous Ge films contradict sharply the concept of amorphous Ge being a microcrystalline material.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
