Abstract

The temperature dependence of the spectral features in the vicinity of the direct band edge of ${\mathrm{ReS}}_{2\ensuremath{-}x}{\mathrm{Se}}_{x}$ single crystals is measured over a temperature range of 25--300 K using piezoreflectance (PzR). From a detailed line-shape fit of the PzR spectra, the temperature dependence of the energies and broadening parameters of the band-edge excitons are determined accurately. The excitonic transition energies at different temperature vary smoothly with the Se composition x, indicating that the natures of the direct band edges of ${\mathrm{ReS}}_{2\ensuremath{-}x}{\mathrm{Se}}_{x}$ are similar. The parameters that describe the temperature variation of the energies and broadening function of the excitonic transitions are evaluated and discussed.

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