Abstract
Ferroelectric (piezoelectric) lead-free K0.1Na0.9Nb0.97Sb0.03O3 (KNNS) thin films were grown on (111) Pt/Ti/SiO2/Si substrates, using radio frequency sputtering. The aim of this work is to determine both the ferroelastic and piezoelectric behaviors associated with the redirection of domains in the lead-free piezoelectric KNNS material. The d33 piezoelectric coefficient was measured using Piezoresponse Force Microscopy (PFM). The value of the piezoelectric parameter (d33 = 73 pm/V) observed for KNNS films is more than 25% higher than d33 values for other lead-free piezoelectric materials reported in the literature. The value of the yield point for the tetragonal KNNS films is Y= 3,83 ± 0.5 GPa. The Elastic modulus is Ef = 122 GPa, and the hardness is Hf= 8.95 GPa. The scratch hardness of the KNNS thin films is Hscr = 5.45 ± 0.2 GPa. Resistance to abrasion is less affected by surface morphological changes than by the indentation measurements.
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