Abstract
Picosecond recombination processes of photoexcited electron-hole plasma in PbSe are directly monitored by time-resolved pump-probe experiments in the wavelength range from 3 to 9 μm. At temperatures T≤70 K, a rapid decrease of carrier density within 100 ps is found for excitation densities higher than 7×1017 cm−3. This behavior is due to recombination by stimulated emission, as is evident from comparative measurements of midinfrared luminescence spectra. At T=300 K, Auger recombination on a time scale of 2 ns is observed below the threshold of stimulated emission. The data for a carrier density of 3×1018 cm−3 give an Auger coefficient of c≂10−28 cm6/s.
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