Abstract
We propose physical unclonable function (PUF) operations using ferroelectric tunnel junctions (FTJs) and verify the effects of their dimension scaling on the PUF. First, device-to-device variation and within-device reproducibility were measured from the FTJs with various dimensions, which were to be embedded to 4×4 FTJ cross-point array. Then, to obtain inter- and intra-chip fractional hamming distances (HDs), intra-chip reproducibility and inter-chip uniqueness were extracted from the FTJ array simulations. As a result, it is revealed that the more stable PUF operations are achievable in the cross-point array with scaled FTJs since inter-device variation is deteriorated much more seriously by the variation of domain number in the ferroelectric layer than intra-device variation.
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