Abstract
This article presents a physical model of the current-assisted photonic demodulator (CAPD) for the time-of-flight (TOF) CMOS image sensor. An analytical expression relating the optical photogenerated current to the input bias and incident light intensity is derived by solving the continuity and drift-diffusion equations along the optical window of the CAPD. The model has been extensively verified with numerical simulations, as well as with published experimental data. Based on the developed model, the CAPD efficiency with respect to peak modulation voltage is discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
