Abstract

Carbon nanotubes (CNTs) have been explored in nanoelectronics to realize desirable device performances. Thus, carbon nanotube network field-effect transistors (CNTNFETs) have been developed directly by means of alcohol catalytic chemical vapor deposition (ACCVD) method using Co-Mo catalysts in this work. Various treated temperatures, growth time, and Co/Mo catalysts were employed to explore various surface morphologies of carbon nanotube networks (CNTNs) formed on the SiO2/n-type Si(100) stacked substrate. Experimental results show that most semiconducting single-walled carbon nanotube networks with 5–7 nm in diameter and low disorder-induced mode (D-band) were grown. A bipolar property of CNTNFETs synthesized by ACCVD and using HfO2as top-gate dielectric was demonstrated. Various electrical characteristics, including drain current versus drain voltage(Id-Vd), drain current versus gate voltage(Id-Vg), mobility, subthreshold slope (SS), and transconductance(Gm), were obtained.

Highlights

  • Carbon nanotube field-effect transistors (CNTFETs) have been explored in nanoelectronics to realize desirable device characteristics [1,2,3,4,5,6,7,8,9,10,11]

  • Various methods were used to synthesize the carbon nanotube networks (CNTNs), some electrical characteristics of CNTNs fabricated by alcohol catalytic chemical vapor deposition (CVD) (ACCVD) remain not totally understood

  • Since the results show that the C value of CNTNs synthesized by ACCVD is to be around 57 cm−1 nm2, most semiconducting

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Summary

Introduction

Carbon nanotube field-effect transistors (CNTFETs) have been explored in nanoelectronics to realize desirable device characteristics [1,2,3,4,5,6,7,8,9,10,11]. Both n-type and p-type single-walled carbon nanotube (SWCNT) field-effect transistors (FETs) with top-gate electrodes in the conventional metal-oxidesemiconductor field-effect transistor (MOSFET) structures were demonstrated [1]. SWCNT random network thin film transistor with a 105 of on/off ratio and a ∼8 cm2/C-s of field-effect mobility was demonstrated using water-assisted plasma-enhanced CVD (PECVD) [17]. Attempt to explore some characteristics to gain better physical and electrical insights into the properties of CNTN field-effect transistors (CNTNFETs)

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