Abstract
We have proposed a dual sampling method in intermittent-contact-mode atomic force microscopy with a piezoresistive cantilever for photothermal (PT) measurements. This method realizes a sensitive detection of thermal expansion in a sample by excluding crosstalk from photoabsorption signals generated at the piezoresistive sensor on the cantilever. We have confirmed the feasibility of this method through the excitation photon energy dependence of the PT signal measured on Si and GaAs.
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