Abstract
Abstract Two types of photothermal measurement technique will be presented, which might allow the high spatially resolved investigation of thermal properties of substrates and thin films. Both methods employ measurement techniques which are based on scanning near-field microscopy. In the first case we show initial experimental results of periodic thermal expansion measurements of a laser excited sample surface using a scanning tunneling microscope. In the second case we present the principle of a scanning thermal microscope, which measures the temperature distribution above the sample surface.
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