Abstract
A photothermal microscope has been combined with an experimental set-up allowing damage threshold measurements at the same wavelength. The microscope is based on photothermal deflection of the transmitted probe beam: the CW pump beam (1.06 μm wavelength) and the probe beam are collinear and focused through the same objective. The diameter of the pump beam on the sample surface is 1 μm. Laser damage thresholds are measured thanks to a pulsed beam (1.06 μm wavelength and 6 nanosecond pulse) and the spatial position of the pulsed beam is controlled by a CCD camera. This experimental setup has been used to study the behavior of metallic inclusions in dielectric materials in laser damage processes. Results are presented with gold inclusions of about 600 nm in diameter in silica.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
