Abstract
CdS thinfilms implanted using He + were studied using photothermal deflection spectroscopy (PTD) setup, using perpendicular pump-probe configuration. Samples were implanted with increasing ion energy so as to allow the ion to penetrate greater depths. An attempt for 2-dimensional imaging of implanted regions of different samples was carried out. Photothermal measurements were performed Samples were imaged for various modulation frequencies. Modulation frequency at 800 Hz revealed a maximum damaged layer, which corresponds approximately to the half the thickness.
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