Abstract
We report very large photoinduced refractive-index changes Dn, of the order of ~10(2), in lead germanate glass waveguides grown by pulsed-laser deposition. The magnitude of Dn was derived from measurements of diffraction efficiency for gratings written by exposure to 244-nm light through a phase mask, whereas the sign of Dn was determined from ellipsometric data. Results are shown for films grown under oxygen pressures ranging from 1 chi 10(-2) to 6 chi 10(-2)mbars (1.33mbars=1 Torr).
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