Abstract
The photorefractive two-wave mixing gain coefficient \ensuremath{\Gamma} of GaAs:Cr and InP:Fe, cut with different crystallographic orientations, was determined using a cw Nd:YAG (neodymium doped yttrium aluminum garnet) laser at 1064 nm. The polarization and orientation dependence of the gain coefficient \ensuremath{\Gamma} are calculated from the pertinent interaction matrix elements. Results are discussed with respect to the contactless determination of crystallographic parameters via the photorefractive effect.
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