Abstract

We fabricate L3 cavities in a silicon nitride photonic crystal, with cavity modes in the visible range. We demonstrate a noninvasive method to characterize the cavities: the sample is illuminated on its edge and the upward-scattering spectrum is measured. We determine the modes' wavelengths, polarizations, and quality factors. We find modes between 700 and 830 nm with quality factors up to 280, polarized along or perpendicular to the cavity. The tuning of the cavity characteristics by means of its geometric parameters (holes sizes and shift) is discussed. The results are analyzed and compared with numerical simulations.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.