Abstract
Photon stimulated ion desorption from small molecules on Si(100) surfaces and from polymer thin films was studied using time-of-flight (TOF) mass spectrometric techniques. The design and operation of a TOF mass spectrometer during single bunch operation of the Photon Factory 2.5 GeV storage ring is described. Experimental results for H2O/Si(100), DCOOD/Si(100), polymethylmethacrylate and polymethylacrylate thin films are demonstrated as examples of the capabilities of the apparatus.
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