Abstract
Photon stimulated ion desorption (PSID) studies from poly(sulphone) (PS) have been carried out by using high-resolution time-of-flight mass spectrometry. Synchrotron radiation at the Brazilian Synchrotron Light Source (LNLS) operating in a single-bunch mode was used as excitation source. PS was excited at the sulphur 1s-edge and the desorption of small and large fragments has been observed. The results are discussed in terms of the X-ray induced electron stimulated desorption mechanism. The present results contrast with previous ones reported for poly(3-methylthiophene) (PMeT), in which the observation of S + and S 2+ was interpreted solely in terms of an Auger-stimulated ion desorption mechanism.
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