Abstract
Auger electron-photoion coincidence (AEPICO) measurements have been performed for poly-methylmethacrylate 1 (PMMA) thin films induced by oxygen core excitation. The dominant productions of CH ( n51-3) ions were observed at n 1 resonant excitation to O-CH anti-bonding state, and OCH ion was observed at resonant excitation to C-OCH 3 3 anti-bonding state. Their AEPICO yields were strongly dependent on Auger electron kinetic energy and shows enhancement around 505 eV Auger electron energy for each ion. This seems to be related to the spectator resonant Auger-stimulated ion desorption. The correlation between ion desorption and Auger final state for PMMA thin films in the oxygen K-edge region is discussed. © 2001 Elsevier Science B.V. All rights reserved.
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