Abstract
In this work, we review the electrical and optical properties ofInOx and ZnO films, and their use as dynamic optical materials. The transport properties ofthese films are analysed and correlated with the growth parameters. We havestudied the permanent light-induced refractive index changes in our dc-sputteredInOx thin films using pulsed ultraviolet laser radiation at 193 nm.Non-permanent holography recording of information has been achieved inInOx films upon illumination with UV radiation (325 nm). The recording, which appears to beindependent of the electrical state of the material, disappears in the absence of UV lightwith decay times that depend on the material’s specific properties, as these are influencedby the film fabrication conditions. We also review our work on waveguide reflectionsubmicron relief gratings on multilayer waveguides operating near 1550 nm, fabricated byexcimer laser ablation at 248 nm.
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